IEEE ISQED05 - Call for Participation

Discussion in 'AutoCAD' started by info, Feb 17, 2005.

  1. info

    info Guest

    Call for Participation

    6th IEEE International Symposium on

    QUALITY ELECTRONIC DESIGN

    March 21-23, 2005
    DoubleTree Hotel, San Jose, CA, USA

    www.isqed.org

    ISQED is the pioneer and leading international conference dealing with
    the design for yield, manufacturability and quality issues
    front-to-back. Register early to take advantage of the reduced registration
    fee.
    Please visit the web site at www.isqed.org for the advance program and
    registration procedure. See below for more details.


    ISQED conference spans three days, Monday through Wednesday, in three
    parallel tracks, hosting near 100 technical presentations, six keynote
    speakers, two panel discussions, workshops /tutorials and other informal
    meetings.

    CONFERENCE HIGHLIGHTS
    TUTORIALS/WORKSHOPS
    ISQED 2005 offers a single full-day tutorial track focusing on a range
    of critical issues in circuit design and packaging at sub-90nm CMOS. We
    are pleased to have several noted experts in their respective fields
    (Design methodologies for implementing robust circuits with desired power
    performance characteristics, Managing leakage power, Circuit Design in
    the Presence of Uncertainty, and Modeling and Design of Chip-Package
    Interface) to present the latest research in these compelling areas as
    follows:

    Design of sub-90nm Circuits and Design Methodologies
    Ruchir Puri, IBM TJ Watson Research Center, NY
    Sachin Sapatnaker, Electrical & Computer Engineering, University of
    Minnesota
    Tanay Karnik, Intel Circuit Research Labs, Hillsboro, OR
    Rajiv Joshi, IBM T J Watson Research Center, NY

    Modeling and Design of Chip-Package Interface
    Luca Daniel, Massachusetts Institute of Technology, Cambridge, MA
    Byron Krauter, IBM Microelectronics, Austin, TX
    Lei He, UCLA EE Dept, Los Angeles, CA

    PLENARY SESSIONS

    John Kibarian, President & CEO, PDF Solutions
    Ashok K. Sinha, Sr. VP & GM, Applied Materials
    Joe Sawicki, Vice President & General Manager, Mentor Graphics
    Aki Fujimura, Chief Technology Officer, Cadence Design Systems
    Kurt A. Wolf, Director, Library Management Division, TSMC
    Bernard Candaele, Department Head, SoC, IC & EDA, Thales, Paris ,
    France


    PANEL DISCUSSIONS
    ISQED is pleased to offer two high-power evening panel discussion
    sessions, where many leading experts, address the important issue of quality
    design. These panels would focus on the following topics:

    1 IP Creation and Use
    What roadblocks are ahead or it is just clear and bumpy road?

    2 Nanoelectronics: Evolution or Revolution?


    LUNCHEON SPEECH
    IP Quality: A Design, not a Verification Problem
    Michael Keating, Synopsys


    TECHNICAL SESSIONS
    ISQED Technical sessions start on Tuesday March 22, and continue until
    the afternoon of Wednesday, March 23. Beside the above plenary
    sessions, panel discussions, and workshops, the program consists of nineteen
    technical sessions featuring near 100 papers on various challenging
    topics related to design for manufacturability and quality. A list of topics
    includes:

    - EDA Tools & IP Blocks; Interoperability and Implications (EDA)
    - Design for Manufacturability & Quality (DFMQ)
    - Design Verification and Design for Testability (DVFT)
    - Package - IC Design Interactions & Co-Design (PDI)
    - Robust Device, Interconnect, and Circuits (RDIC)
    - Physical Design, Methodologies & Tools (PDM)
    - Effects of Technology on IC Design, Performance, Reliability, and
    Yield
    - System Level Design, Methodologies and Tools (SDM)

    REGISTRATION
    Please refer to ISQED web site at www.isqed.org for information
    regarding the tutorials, conference, tutorials, and hotel registration.
    Early
    registration is recommended to take advantage of the discounted
    registration fee.
     
    info, Feb 17, 2005
    #1
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